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Savant eNewsletter August 2004

65/45nm Challenges for Dick Tracy watch – Savant SoC Conference

 

 

65/45nm Challenges for Dick Tracy watch – Savant SoC Conference

As more and more phone and PDA manufacturers integrate similar functions in their products, the separating line between phones and PDAs is completely disappearing. The resulting Smart Mobile Devices (SMDs) are becoming the standard products for mass markets. Parallel to these developments, companies with little or no history in the phone market are developing the first generation of practical Dick Tracy watches that are bringing a new dimension to this technology convergence.  Today’s 3G WCDMA phones boast downloading speeds of 384kbps, and many advanced, complex features are gradually becoming standard for these phones (e.g., Integrated megapixel camera sensor, more than 10MB of DRAM, 802.11b, Bluetooth, GPS, support for IPv4/IPv6 dual stack, hot swap slot for SD Cards, MMC Cards, email and web browsing, and much more.)

Many PDA manufacturers have already combined their products with phones, and today several CDMA-based PDA phones or personal communicators are gaining market share in this exploding dynamic segment. In addition to a larger LCD and a full qwerty keyboard, these manufacturers provide many other capabilities, such as USB 2.0, more than 80MB of DRAM, support for multiple operating systems (Windows, Symbian, etc.), and much more.

As in the PC industry, SMDs’ overall system performance is driven by games, communication protocols, business productivity tools, etc. However, there are two major differences—people in their higher-end SMDs expect (1) a smaller/lighter package and (2) a longer battery life!

High-level of integration (System-on-Chip) in conjunction with advances in CMOS technology has given the designer the needed tools to integrate more functionality into a smaller die area (smaller/lighter package). At the same time, designers need to deal with tradeoffs associated with the advances in CMOS scaling to meet the power-related issues (battery life). As CMOS technologies scale down from 130nm to 90nm and lower, the main approach for reducing power has been to scale down the supply voltage (VDD). This voltage scaling is an effective technique for controlling the dynamic power (CV2F) of ICs. However, as we lower the supply voltage (90nm and lower), circuit speed degrades since switching-delay-time is proportional to the load capacitance and the ratio of transistor threshold voltages to transistor supply voltage (Vth/VDD). For fast transistor switching, the Vth must also be lowered in proportion to VDD, which then increases the leakage current.

New power-aware design methodologies and EDA tools are trying to address the leakage-current issue in 90nm, 65nm, and beyond. Selected semiconductor manufacturers working on 65nm-process technology are claiming that they are shrinking the equivalent 90nm designs by 40% to 50%, boosting transistor performance by more than 35 percent, and reducing the leakage current (i.e., the static power consumption) in the idle transistors by a significant factor. These advances will allow designers to integrate hundreds of millions of transistors that support both analog and digital functions in the next generation System-on-Chip (SoC) designs to meet demanding applications such as Smart Mobile Devices with TV, biometric, and many other advanced features.

These challenging topics are some of the issues that will be addressed in the Savant’s upcoming SoC Conference.  More information is provided below or at www.savantcompany.com

Farhad Mafie

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Exclusive!  New SoC Conference From Savant!

The 2nd International System-on-Chip Conference,  November 3 and 4, 2004, Bay Area 

http://www.savantcompany.com/SoC_Nov2004/SoC_Call.htm

Call for Presenters:  The Savant SoC Conference Organizing Committee is pleased to announce a Call for Presenters for The 2nd International System-on-Chip (SoC) Conference, to be held in the Bay Area.

Track and session presenters, keynote speakers, and panel members who can contribute their professional expertise have a wonderful opportunity to share their innovative SoC technology/SoC products at this event with a very focused and targeted audience.

Deadline for proposals/abstracts:  August 16, 2004. (Please be sure to include a short bio and your photo along with your proposal.) 

Presenters and Keynote speakers will be considered for leading-edge topics such as:

  • CMOS, Scaling, and the Future
  • Interconnect-Centric SoC Design
  • ASIC/SoC/Foundry for 90nm and Sub-90nm
  • SoC Design Challenges 
  • Configurable CPUs and DSPs for SoC Platform Design
  • SoC Design Using Programmable ICs & Structured ASICs
  • System-on-Chip Platform Design
  • EDA Tools for 90nm and Post-90nm
  • New Ideas in Placement and Floorplanning
  • New Opportunities in High-level Synthesis
  • ASIC/SoC Design Methodologies
  • IP Design, Modeling, and Reuse
  • SoC Testing and Verification

Panel moderators and panel members will be considered for topics such as:

  • Configurable CPUs and DSPs for SoC Platform Design
  • IP Design, Modeling, and Reuse
  • EDA Tools for 90nm and Post-90nm
  • SoC Testing and Verification

Deadline for proposals/abstracts:  August 16, 2004. (Please be sure to include a short bio and your photo with your proposal.) 

To take advantage of this opportunity, please contact the Savant SoC Marketing Team at soc@savantcompany.com before August 16, 2004. Announcements to the public and general conference registration will begin early September 2004.

We look forward to talking with you and answering any questions you may have.  Please share this information with your colleagues!

For more information, contact Savant Marketing:  Marketing@savantcompany.com

Please feel free to share this eNewsletter with other professionals!

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We can customize any of our seminars or develop a new seminar to meet the unique challenges and needs of your organization.

 

Copyright © 2004 by Savant Company Inc. PO Box 51330, Irvine, CA 92619, U.S.A. All rights reserved. All names contained herein are the trademarks of their respective holders.

 

 

   

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